The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Nov. 24, 2010
Applicant:

Yutaka Konomura, Tokyo, JP;

Inventor:

Yutaka Konomura, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/04 (2006.01); A61B 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endoscope apparatus is adapted to be inserted into an inside of a subject and observe the inside of the subject and includes: an observation optical system which has a first optical path and a second optical path with parallax; an imaging portion on which a light passing through the first optical path and a light passing through the second optical path are formed; a diaphragm portion which selectively blocks out the first optical path or the second optical path; a distance measurement portion which measures a distance to the subject on the basis of parallax between a first image formed on the imaging portion via the first optical path and a second image formed on the imaging portion via the second optical path; a displacement amount detection portion which detects a displacement amount between two first images acquired with a time interval therebetween; and a measurement environment determination portion which determines, on the basis of the displacement amount, whether or not the first image and the second image are suitably used for measurement by the distance measurement portion.


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