The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Nov. 13, 2007
Applicants:
Roland Barth, Jena, DE;
Frank Behrendt, Jena, DE;
Roland Bergner, Jena, DE;
Klaus-ditmar Voigt, Jena, DE;
Inventors:
Roland Barth, Jena, DE;
Frank Behrendt, Jena, DE;
Roland Bergner, Jena, DE;
Klaus-Ditmar Voigt, Jena, DE;
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/107 (2006.01); A61B 3/15 (2006.01); A61B 3/117 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/0041 (2013.01); A61B 3/107 (2013.01); A61B 3/117 (2013.01); A61B 3/1005 (2013.01);
Abstract
An opthalmological measuring instrument, e.g. for determining the corneal curvature, anterior chamber depth, axial length, or the like, including measuring systems for determining measurement of the mentioned physical parameters. The measuring systems are connected to an evaluation unit which verifies whether quality parameters regarding the measurements are satisfied and generates a corresponding signal that indicates to the medical professional user that a proper measurement can be taken.