The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Jul. 13, 2010
Applicants:
Thomas D. Padrick, Seattle, WA (US);
Jack T. Holladay, Bellaire, TX (US);
Inventors:
Thomas D. Padrick, Seattle, WA (US);
Jack T. Holladay, Bellaire, TX (US);
Assignee:
Wavetec Vision Systems, Inc., Aliso Viejo, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); A61F 2/16 (2006.01);
U.S. Cl.
CPC ...
G02C 7/022 (2013.01); A61F 2/16 (2013.01); A61F 2/1662 (2013.01); G02C 7/024 (2013.01);
Abstract
An ophthalmic method for determining a relationship between aphakic ocular power and estimated effective lens position (ELP) of an intraocular lens (IOL) to be implanted in a patient's eye. The method can be used to determine an estimate of the ELP of an IOL given the aphakic ocular power of the patient's eye, for example, without measurement of the corneal curvature or axial length of the patient's eye. The estimate of ELP can then be used to determine a suitable value of optical power for the IOL to be implanted in the patient's eye.