The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Feb. 06, 2012
Applicants:
Tamir Olpak, Petah Tigwa, IL;
Arie Gez, Netanyya, IL;
Inventors:
Tamir Olpak, Petah Tigwa, IL;
Arie Gez, Netanyya, IL;
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 13/10 (2006.01); B41F 1/34 (2006.01); B41C 1/00 (2006.01); B41C 1/10 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
B41C 1/00 (2013.01); B41C 1/1075 (2013.01); G03F 7/2055 (2013.01);
Abstract
A method for analyzing a mandrel () operation in an imaging device () includes installing the mandrel into the imaging device; securing the mandrel between a head stock () and a tail stock (); attaching a first encoder () to the head stock and a second encoder () to the tail stock; rotating the mandrel; reading signals from first encoder; reading signals from second encoder; comparing the first results and the second results; and if the first results do not match with the second results stopping the imaging device.