The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Apr. 05, 2010
Tetsuya Shimada, Osaka, JP;
Hirokazu Tanaka, Osaka, JP;
Akira Okamoto, Nagaokakyo, JP;
Yoshinori Mizuma, Nagaokakyo, JP;
Seiichi Okada, Nagaokakyo, JP;
Tetsuya Shimada, Osaka, JP;
Hirokazu Tanaka, Osaka, JP;
Akira Okamoto, Nagaokakyo, JP;
Yoshinori Mizuma, Nagaokakyo, JP;
Seiichi Okada, Nagaokakyo, JP;
Espec Corp., , JP;
Abstract
A dew formation testing device has an adjustment tank capable of adjusting the temperature and humidity of air to predetermined temperature and humidity, a testing tank installed separately from the adjustment tank and having a sample base that has a mounting surface, onto which a testing sample W can be placed, and that is capable to cool the mounting surface, and ducts that link the adjustment unit and the testing tank. The testing tank is provided with an air guide member that, when air flowing into the testing tank through the duct flows onto the sample base from a side of the sample base, guides the air in the direction tilted downward at a predetermined angle, the guidance being performed at a position right above the sample base at an end thereof which is on the upstream side of the air flow.