The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Jul. 22, 2013
Applicants:
Andrei Abelev, Mclean, VA (US);
David C Young, Long Beach, MS (US);
Philip J. Valent, Slidell, LA (US);
Inventors:
Andrei Abelev, Mclean, VA (US);
David C Young, Long Beach, MS (US);
Philip J. Valent, Slidell, LA (US);
Assignee:
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for measuring characteristics of a specimen. The apparatus can accurately measure, for example, but not limited to, peak, evolution, and residual values of the undrained shear strength, yield, and viscous and plastic flow (including hardening and softening) characteristics of cohesive sediments at various pre-set and variable values of the rotational velocity of the vane sensor.