The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Dec. 13, 2010
Applicants:
Barry A. Fetzer, Renton, WA (US);
Patrick Lee Anderson, Sammamish, WA (US);
Hien T. Bui, Renton, WA (US);
Steven Ray Walton, Wilkeson, WA (US);
Inventors:
Barry A. Fetzer, Renton, WA (US);
Patrick Lee Anderson, Sammamish, WA (US);
Hien T. Bui, Renton, WA (US);
Steven Ray Walton, Wilkeson, WA (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/265 (2006.01); G01N 29/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe is used to inspect the health of a corner radius within an elongate internal cavity of a structure. The probe is transported through the cavity on a carriage that maintains the probe a substantially constant distance from the corner radius as the carriage traverses changes in the cross sectional shape of the cavity.