The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Apr. 23, 2010
Applicant:

Ralf Reimelt, Freiburg, DE;

Inventor:

Ralf Reimelt, Freiburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/00 (2006.01); H01P 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An arrangement for measuring fill level of a fill substance in a container, comprising: a fill level measuring device, wherein the device includes measuring device electronics and an antenna connected to the measuring device electronics; and at least one feedthrough installed in a signal path of the microwave signals or the reflection signals; the feedthrough. The feedthrough comprises a hollow conductor, into which a microwave transparent window is inserted gas tightly. The window comprises: a disk, whose thickness corresponds approximately to a half wavelength or a small integer multiple of the half wavelength of a first, hollow conductor propagation capable, signal mode of the microwave signals at a predetermined signal frequency in the disk; and two matching layers located on oppositely lying, outer surfaces of the disk. The thickness of each matching layer corresponds approximately to a fourth of the wavelength of the first, hollow conductor propagation capable, signal mode of the microwave signals at the predetermined signal frequency in the matching layers.


Find Patent Forward Citations

Loading…