The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Jul. 05, 2011
Applicants:

Lendon L. Bendix, Melbourne, FL (US);

Derek A. Turner, Melbourne, FL (US);

Inventors:

Lendon L. Bendix, Melbourne, FL (US);

Derek A. Turner, Melbourne, FL (US);

Assignee:

TFRI, Inc., Melbourne, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fabricating process for a multi-layer printed circuit board containing embedded passive components is provided. The method includes a calibration step wherein a calibration measurement is taken of the geometry or at least one electrical parameter of an arrangement of calibration test points for a circuit forming process, such as masking, etching and/or lamination. A process control step is performed during the process, wherein a process control measurement is taken of at least one electrical parameter at one or more process control test points along one or more axes outside areas in which a circuit is to be formed. An analysis is performed of at least the calibration measurement and the process control measurement to calculate a CAD geometry change required to improve precision of embedded passive components to be printed on the multi-layer printed circuit board. The CAD geometry is modified in accordance with the calculated CAD geometry change, and multi-layer printed circuit boards containing embedded passive components are manufactured in accordance with the modified CAD geometry. The analyzing step may model variability and adapt to it.


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