The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Jan. 03, 2011
Applicants:

Karl F. Greb, Missouri City, TX (US);

Nicholas H. Schutt, Villeneuve-Loube, FR;

Henry Duc Nguyen, Houston, TX (US);

Inventors:

Karl F. Greb, Missouri City, TX (US);

Nicholas H. Schutt, Villeneuve-Loube, FR;

Henry Duc Nguyen, Houston, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An error monitor receives a first list of selected system events with each selected system event having an associated range. The occurrence of each selected system event is counted over a selected time period. An error indication is provided based on a comparison of each of the counts of the occurrence of each selected system event over the selected time period with the associated range. Operational profiles are used to store lists of selected system events with each selected system event having an associated range for each operational profile.


Find Patent Forward Citations

Loading…