The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Oct. 01, 2012
Applicant:

The Mathworks, Inc., Natick, MA (US);

Inventors:

Matthew Englehart, Olmstead Township, OH (US);

Peiter J. Mosterman, Framingham, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an embodiment, a technique for analyzing a model, either statically or dynamically, to check the model for one or more specified patterns with respect to accessing a data store associated with the model. The patterns may include, for example, writing to a data store prior to reading the data store, reading the data store prior to writing the data store, writing to the data store multiple times prior to reading the data store, reading the data store multiple times before writing the data store, etc. The model may be an executable graphical model that is generated in a graphical modeling environment. A result may be generated based on the analyzing. The result may be output.


Find Patent Forward Citations

Englehart, Matthew. (2014). Proving latency associated with references to a data store (U.S. Patent No. 8762311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8762311

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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