The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Jul. 25, 2006
Applicants:

Yoshiyasu Fujiwara, Kakogawa, JP;

Kazunori Oda, Kakogawa, JP;

Inventors:

Yoshiyasu Fujiwara, Kakogawa, JP;

Kazunori Oda, Kakogawa, JP;

Assignee:

TLV Co., Ltd., Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F16T 1/48 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
F16T 1/48 (2013.01); G06Q 10/20 (2013.01);
Abstract

Either a complete overhaul for replacing with recommended devices the entire number of devices in a large group of managed devices T, or a partial overhaul for repairing or replacing with recommended devices only those managed devices T that are malfunctioning is selectively performed as an initial overhaul. A complete test involving the entire number of the managed devices T is then periodically performed to determine whether the devices are operating normally or have a malfunction. Any devices found to be malfunctioning during any complete test are repaired or replaced with recommended devices.


Find Patent Forward Citations

Fujiwara, Yoshiyasu. (2014). Device management method, analysis system used for the device management method, data structure used in management database, and maintenance inspection support apparatus used for the device management method (U.S. Patent No. 8762105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8762105

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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