The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Sep. 09, 2010
Applicant:
Martin Krucinski, Webster, NY (US);
Inventor:
Martin Krucinski, Webster, NY (US);
Assignee:
Xerox Corporation, Norwalk, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method for measuring substrate media thickness including a nip assembly having a first nip for engaging substrate media and transporting the media along a process direction. The first nip has a nip velocity. A sensor is in operative communication with the first nip for sensing the nip velocity. A processor is operably connected to the sensor. The processor determines a media thickness responsive to a change in nip velocity detected by the velocity sensor upon entry of the media in the first nip.