The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Sep. 20, 2005
Glenn R. Engel, Snohomish, WA (US);
Glen L. Purdy, Jr., Snohomish, WA (US);
Jerry J. Liu, Sunnyvale, CA (US);
Glenn R. Engel, Snohomish, WA (US);
Glen L. Purdy, Jr., Snohomish, WA (US);
Jerry J. Liu, Sunnyvale, CA (US);
JDS Uniphase Corporation, Milpitas, CA (US);
Abstract
Probe configuration is achieved in a measurement system in which probes are given possible configuration data depending upon conditions in an area relevant to the area of the probe. The possible probe configurations include global boundaries, such as time, and each probe then, based upon the possible configurations, selects a configuration. In one embodiment, the probe may interact with a central processor to further define the probe configuration. In one embodiment, probes may communicate with other probes, both to help define their operating environment and to optionally provide configuration data to another probe.