The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Aug. 19, 2011
Applicants:

Wei Zhang, Houston, TX (US);

Christopher M. Jones, Houston, TX (US);

Michael T. Pelletier, Houston, TX (US);

Robert S. Atkinson, Richmond, TX (US);

Stephen A. Zannoni, Houston, TX (US);

Inventors:

Wei Zhang, Houston, TX (US);

Christopher M. Jones, Houston, TX (US);

Michael T. Pelletier, Houston, TX (US);

Robert S. Atkinson, Richmond, TX (US);

Stephen A. Zannoni, Houston, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A processor accepts sensor data about a geological formation from a sensor. The sensor data is such that processing the sensor data using a processing technique to estimate a parameter of the geological formation without a constraint, whose value is not yet known, produces a plurality of non-unique estimates of the parameter. The processor accepts more than two time-displaced images of fluid sampled from the geological formation. The time displacements between the images are substantially defined by a mathematical series. The processor processes the images to determine the constraint. The processor processes the sensor data using the processing technique constrained by the constraint to estimate the parameter of the geological formation. The processor uses the estimated parameter to affect the drilling of a well through the geological formation.


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