The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Mar. 03, 2009
Applicants:

Ik-beom Lee, Yongin-si, KR;

Ha-young Yang, Yongin-si, KR;

Jae-ho Jeon, Seongnam-si, KR;

Sung-kwon JO, Suwon-si, KR;

Inventors:

Ik-Beom Lee, Yongin-si, KR;

Ha-Young Yang, Yongin-si, KR;

Jae-Ho Jeon, Seongnam-si, KR;

Sung-Kwon Jo, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 72/08 (2009.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring channel quality of a Base Station (BS) by using a ranging signal in a broadband wireless communication system is provided. The method includes estimating a time offset of the ranging signal received through a ranging channel, measuring channel quality by using the ranging signal including the time offset, determining whether distortion occurs in the measured channel quality by using the time offset, and compensating for distortion of the measured channel quality.


Find Patent Forward Citations

Lee, Ik-Beom. (2014). Apparatus and method for measuring channel quality by using ranging signal in broadband wireless communication system (U.S. Patent No. 8761680). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8761680

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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