The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Jun. 14, 2011
Zhi Yang, Vernon Hills, IL (US);
Alexander Zamyatin, Hawthorn Woods, IL (US);
Satoru Ohishi, Tochigi-ken, JP;
Anusha Muthu-natarajan, Buffalo Grove, IL (US);
Zhi Yang, Vernon Hills, IL (US);
Alexander Zamyatin, Hawthorn Woods, IL (US);
Satoru Ohishi, Tochigi-ken, JP;
Anusha Muthu-Natarajan, Buffalo Grove, IL (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-Shi, JP;
Abstract
Noise assessment is important to image quality evaluation as well as image processing. For example, the noise level estimation is used as criteria for terminating an iterative noise reduction process. To determine a meaningful noise level, the pixels in featureless regions are separated from the rest of the image. A new concept of pseudo-standard deviation (PSD) is introduced to automatically determine simple and reliable noise level estimates. Furthermore, a histogram of PSD is constructed with fine bins to calculate the moving average of the histogram. The first peak in filtered histogram gives the most representative noise measure as a desired approximation of true standard deviation.