The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Jun. 29, 2012
Applicants:

Chih-kuang Chang, New Taipei, TW;

Xin-yuan Wu, Shenzhen, CN;

Zheng-zhi Zhang, Shenzhen, CN;

Jin-gang Rao, Shenzhen, CN;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Xin-Yuan Wu, Shenzhen, CN;

Zheng-Zhi Zhang, Shenzhen, CN;

Jin-Gang Rao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for creating measurement codes automatically using an electronic device. In the method, a directory tree is created to display a plurality of feature elements. A selected feature element in the directory tree is determined; and output axes of the selected feature element are determined, according to an attribute type and a measurement type of the selected feature element. A marked number of the selected feature element is received; and a reference value, an upper tolerance, and a lower tolerance of the selected feature element are obtained. Measurement codes of the selected feature element are created according to the above-described obtained information, and the measurement codes are stored in a storage device of the electronic device.


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