The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Nov. 14, 2012
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Olga Russakovsky, Palo Alto, CA (US);

Yuanqing Lin, Sunnyvale, CA (US);

Kai Yu, San Jose, CA (US);

Fei-Fei Li, Stanford, CA (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/62 (2013.01); G06K 9/46 (2013.01);
Abstract

A method is provided for classifying an image. The method includes inferring location information of an object of interest in an input representation of the image. The method further includes determining foreground object features and background object features from the input representation of the image. The method additionally includes pooling the foreground object features separately from the background object features using the location information to form a new representation of the image. The new representation is different than the input representation of the image. The method also includes classifying the image based on the new representation of the image.


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