The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Aug. 12, 2010
Atsuro Suzuki, Hitachi, JP;
Fumito Watanabe, Kashiwa, JP;
Hironori Ueki, Hachioji, JP;
Yasutaka Konno, Saitama, JP;
Shinichi Kojima, Hitachinaka, JP;
Yushi Tsubota, Hitachi, JP;
Atsuro Suzuki, Hitachi, JP;
Fumito Watanabe, Kashiwa, JP;
Hironori Ueki, Hachioji, JP;
Yasutaka Konno, Saitama, JP;
Shinichi Kojima, Hitachinaka, JP;
Yushi Tsubota, Hitachi, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
In a state where a subjectis not present, a pre-processing unitchanges the focal spot position that becomes the position of an X-ray tube, acquires the X-ray incidence rate of each detection module at each focal spot position, approximates the X-ray incidence rate of each detection module by the X-ray incidence rate of a module in which a reference detector is present, and stores the coefficient of an approximate polynomial in a storage unit. When a scanning of the subjectis performed, the X-ray incidence rate of each detection module is calculated using the X-ray incidence rate of the module in which the reference detector is present and the stored coefficient, and sensitivity correction data relating to each focal spot position is obtained using the calculated X-ray incidence rate when the scanning of the subject is performed.