The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Sep. 25, 2012
Applicant:

The Johns Hopkins University, Baltimore, MD (US);

Inventors:

Philippe M. Burlina, North Bethesda, MD (US);

Amit Banerjee, Burtonsville, MD (US);

Saurabh Vyas, Odenton, MD (US);

Luis Garza, Baltimore, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting a skin condition may include employing a multiband hyperspectral sensor to obtain multi-spectral data, employing the multi-spectral data to map constitutive skin parameters to corresponding spectral signatures via a forward model that enables generation of a set of samples including a plurality of parameters mapped to a plurality of spectral signatures, utilizing the set of samples to employ machine learning to generate an inverse model to enable mapping of a spectral signature of skin of a patient to corresponding skin parameters, estimating constitutive skin parameters of the skin of the patient based on the inverse model, and determining a distribution of the constitutive parameters for one or more skin locations.


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