The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Jan. 03, 2011
Applicants:
Nathaniel J. Kemp, Concord, MA (US);
Vladimir Zagrodsky, El Dorado Hills, CA (US);
Inventors:
Nathaniel J. Kemp, Concord, MA (US);
Vladimir Zagrodsky, El Dorado Hills, CA (US);
Assignee:
Volcano Corporation, San Diego, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01);
Abstract
A method for artifact management in a rotational imaging system is presented. The method includes the steps of acquiring data employing a helical scanning pattern over N revolutions, where N is greater than 1, and detecting at least one artifact in the acquired data of each revolution. The method further includes segmenting the data acquired over N revolutions into N-1 data frames each bounded by at least one of the at least one artifacts.