The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Aug. 19, 2011
Applicants:

Kohei Gemma, Kanagawa, JP;

Takehisa Ono, Kanagawa, JP;

Noriaki Ida, Kanagawa, JP;

Takeshi Kamiya, Kanagawa, JP;

Inventors:

Kohei Gemma, Kanagawa, JP;

Takehisa Ono, Kanagawa, JP;

Noriaki Ida, Kanagawa, JP;

Takeshi Kamiya, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

The X-ray imaging system includes an X-ray source, a console, an X-ray controller for controlling an operation of the X-ray source according to X-ray control parameters set by the console, and an X-ray detector for detecting X-ray radiated from the X-ray source and transmitted through a subject and thereby outputting an image signal of an X-ray image of the subject. The console includes an input unit for entering the X-ray control parameters, which are information for controlling the operations of the X-ray source and a controller for holding setting range information representing an allowable range of values of the X-ray control parameters and making a judgment as to whether values of the entered X-ray control parameters are settable values according to the setting range information and informing an user of the console of the judgment.


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