The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Sep. 06, 2005
Nathalie Cammas, Sens de Bretagne, FR;
Stéphane Pateux, Saint Gregoire, FR;
Nathalie Laurent-chatenet, Andernos les Bains, FR;
Nathalie Cammas, Sens de Bretagne, FR;
Stéphane Pateux, Saint Gregoire, FR;
Nathalie Laurent-Chatenet, Andernos les Bains, FR;
Orange, Paris, FR;
Abstract
The invention concerns a method which consists in analyzing a field of motion of images, estimated by using a first mesh, to detect a faulty area in the first mesh, and in locating a rupture line in said area; then generating a second mesh including a faultless part consisting of meshes of the first mesh outside the faulty area and two sub-meshes which overlap in a region including the rupture line. Each of the two sub-meshes includes respective meshes delimited by nodes including nodes shared with the faultless part, located at the boundary of the faulty area, and additional nodes not belonging to the faultless part, the rupture line being located between the respective nodes of the two sub-meshes shared with the faultless part. Said second mesh is used to finally estimate the field of motion in the group of images concerned.