The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Dec. 30, 2011
Applicants:

William D. Johns, Tokyo, JP;

David L. Whitaker, Laguna Beach, CA (US);

Ikuya Tagawa, Hiratsuka, JP;

Yoshihiro Shiroishi, Tokyo, JP;

Inventors:

William D. Johns, Tokyo, JP;

David L. Whitaker, Laguna Beach, CA (US);

Ikuya Tagawa, Hiratsuka, JP;

Yoshihiro Shiroishi, Tokyo, JP;

Assignee:

HGST Netherlands B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/02 (2006.01); G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a system includes a medium, a magnetic head having a write element adapted for writing data to the medium, a MAMR element and/or a TAMR element adapted for assisting recording on the medium, the MAMR element having a microwave-generating portion that receives current for operation thereof, the TAMR element having a localized heat-generating portion that receives current for operation thereof, and a read element adapted for reading data from the medium, a device adapted for measuring environmental conditions relating to the TAMR/MAMR elements and the medium, and a controller adapted for controlling operation of the magnetic head and adjusting operating parameters of the system based on the environmental conditions. The environmental conditions include temperature, a reproduced signal of the read element, and/or clearance between the TAMR/MAMR elements and the medium. The operating parameters include the clearance, amount of current injected to the TAMR/MAMR elements, and/or write current.


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