The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Dec. 27, 2010
Yasuhiro Nihei, Kanagawa, JP;
Yasuhiro Nihei, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
A method for measuring a deviation in timing of start of writing in scanning lines is implemented by an optical scanning device that scans a surface to be scanned with light beams from light-emitting elements having first and second light-emitting elements which are arranged so as to be displaced from each other in a direction corresponding to a direction of the scanning lines. The method includes: detecting timing at which light from the first light-emitting element is received by a light receiving element, as a first time, the light receiving element outputting a synchronization detecting signal before start of writing; detecting timing at which light from the second light-emitting element is received by the light receiving element, as a second time; and obtaining the deviation in timing for the second light-emitting element with respect to the first light-emitting element based on a difference between the first and second time.