The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Nov. 04, 2011
Applicants:
Hyeon-bong Pyo, Daejeon, KR;
Moon Youn Jung, Daejeon, KR;
Inventors:
Hyeon-Bong Pyo, Daejeon, KR;
Moon Youn Jung, Daejeon, KR;
Assignee:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for measuring the size of microparticles includes: measuring an extinction spectrum of a medium having microparticles dispersed therein; and calculating average size of the microparticles based on the measured extinction spectrum and the Mie scattering theory.
Pyo, Hyeon-Bong. (2014). Method and apparatus for measuring size of microparticles (U.S. Patent No. 8760646). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8760646
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile