The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

May. 24, 2011
Applicants:

Garland Christian Misener, Portland, ME (US);

James Edward Milan, Buxton, ME (US);

Robert W. Lachapelle, Leeds, ME (US);

Inventors:

Garland Christian Misener, Portland, ME (US);

James Edward Milan, Buxton, ME (US);

Robert W. Lachapelle, Leeds, ME (US);

Assignee:

IDEXX Laboratories Inc., Westbrook, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01J 3/30 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of normalizing an analyzer response value of a fluorescence analyzer is provided. The method includes measuring an excitation spectrum of the analyzer and measuring an emission sensitivity spectrum of the analyzer. Next, a normalization factor based at least in part upon the excitation spectrum of the analyzer and the emission sensitivity spectrum of the analyzer is determined. The sample is then analyzed to obtain an uncorrected analyzer response value. A normalized analyzer response value is calculated based at least in part upon the uncorrected analyzer response value and the normalization factor.


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