The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Mar. 30, 2011
Noboru Ihara, Tokyo, JP;
Kazuhiro Sasao, Tokyo, JP;
Noboru Ihara, Tokyo, JP;
Kazuhiro Sasao, Tokyo, JP;
NS Solutions Corporation, Tokyo, JP;
Abstract
A failure analysis apparatus obtains information associated with an operational status of a data center, determines information regarding fault repair work for the data center, based on the information associated with the operational status, and transmits the information regarding the fault repair work to a head mounted display (HMD). The HMD synthesizes and presents computer graphics image data for providing guidance for a method of the fault repair work, with an image of real space, based on the information regarding the fault repair work. After the fault repair work according to the guidance presented by the HMD, if the information associated with the operational status of the data center is newly obtained, the failure analysis apparatus newly determines the information regarding the fault repair work for the data center based on the information associated with the operational status, and transmits the information to the HMD.