The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Aug. 30, 2012
Applicants:

Ganesan Thiagarajan, Bangalore, IN;

Udayan Dasgupta, Bangalore, IN;

Venugopal Gopinathan, Bangalore, IN;

Inventors:

Ganesan Thiagarajan, Bangalore, IN;

Udayan Dasgupta, Bangalore, IN;

Venugopal Gopinathan, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/12 (2013.01); H03M 1/125 (2013.01); H03M 1/1255 (2013.01);
Abstract

A method is provided. An analog signal is received. The analog input signal is compared to first and second reference signals to generate a first comparison result, and the first comparison result and a first time stamp corresponding to the first comparison result are registered. A first portion of a digital signal is generated from the first comparison result. If the comparison result remains substantially the same for a predetermined interval, an ADC is enabled to generate a second comparison result at a sampling instant. A second time stamp that corresponds to the sampling instant is generated. The second comparison result and a second time stamp corresponding to the first comparison result are registered, and a second portion of the digital signal is generated from the second comparison result.


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