The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Feb. 21, 2011
Applicants:

Raman Krishnan Subramanian, Waukesha, WI (US);

Reed F. Busse, Madison, WI (US);

Inventors:

Raman Krishnan Subramanian, Waukesha, WI (US);

Reed F. Busse, Madison, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for enhanced contrast MR imaging include a computer programmed to perform a first scan of an imaging object based on a first fast spin echo (FSE) scan sequence comprising a first series of RF pulses having a first flip angle sequence to acquire a first MR data set and perform a second scan of the imaging object based on a second FSE scan sequence comprising a second series of RF pulses having a second flip angle sequence, wherein the second flip angle sequence is different from the first flip angle sequence to acquire a second MR data set. The computer is further programmed to generate a difference image based on the first and second MR data sets.


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