The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Oct. 02, 2009
Applicants:

Zoltan A. Bodor, Plantation, FL (US);

Matthew T. Goodale, Davie, FL (US);

Oscar Jerome Williams, Miramar, FL (US);

Aurelian Marius Maris, Davie, FL (US);

Inventors:

Zoltan A. Bodor, Plantation, FL (US);

Matthew T. Goodale, Davie, FL (US);

Oscar Jerome Williams, Miramar, FL (US);

Aurelian Marius Maris, Davie, FL (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/06 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endoscope testing apparatus including a base, a main rail coupled to the base, a first centering mount coupled to the main rail, an optical test target holder coupled to the main rail, a second centering mount coupled to the optical test holder, the second centering mount being coaxially alignable with the first centering mount, and an optical scanning device coupled to the main rail and coaxially alignable with the first centering mount and the second centering mount. The test target holder includes an optical test target having a selectively adjustable distance between the optical test target and the second centering mount and a selectively adjustable angle formed between an axis formed by the centering mounts and the test target.


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