The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Feb. 03, 2012
Applicants:

Jiachun Zhou, Gilbert, AZ (US);

Caiyun Yang, Jiangsu Province, CN;

Inventors:

Jiachun Zhou, Gilbert, AZ (US);

Caiyun Yang, Jiangsu Province, CN;

Assignee:

Interconnect Devices, Inc., Kansas City, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A contact probe and method of forming the same are provided, where the contact probe can include a shell including a body having a shell cavity. The contact probe can also include at least one plunger slidably received in the shell cavity and extending through at least one opening in at least one end of the shell. The contact probe can further include a biasing device configured to exert a biasing force on the at least one plunger and at least one insulation member including an insulative material. The at least one insulation member can be disposed on at least a portion of an outer surface of at least one of: the shell and the at least one plunger.


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