The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Dec. 03, 2010
Applicants:

Stuart Bowers, Redmond, WA (US);

Tom Jackson, Redmond, WA (US);

Jim Karkanias, Sammamish, WA (US);

Dave Campbell, Sammamish, WA (US);

Brian Aust, Redmond, WA (US);

Inventors:

Stuart Bowers, Redmond, WA (US);

Tom Jackson, Redmond, WA (US);

Jim Karkanias, Sammamish, WA (US);

Dave Campbell, Sammamish, WA (US);

Brian Aust, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3043 (2013.01);
Abstract

Technology is described that includes a method of feature specification via semantic queries. The method can include the operation of obtaining a data set having an identifier for each data row and a plurality of data features for each data row. A semantic query can be received that can be applied to the dataset that is usable by a machine learning tool. A entity feature map can be supplied that has entities and associated features for use by the machine learning tool. Further, a query structure can be analyzed using the entity feature map to identify input from the dataset for the machine learning tool.


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