The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Aug. 20, 2008
Wallace H. Meyer, Spring, TX (US);
Wallace H. Meyer, Spring, TX (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method for increasing sensitivity in a measurement of at least one of magnitude and direction of resistivity in a subsurface material, the method including: performing a first set of measurements of resistivity of the subsurface material using a first logging instrument; constructing a model of a background signal using the first set of measurements; calculating a predicted response of a second logging instrument to the model of the background signal; performing a second set of measurements of at least one of magnitude and direction of resistivity of the subsurface material using the second logging instrument; deriving a second logging instrument response from the second set of measurements; and subtracting the predicted response from the second logging instrument response to produce a corrected response that has greater sensitivity than the second logging instrument response.