The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Jul. 22, 2010
Noboru Nakajima, Tokyo, JP;
Noboru Nakajima, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Provided is a marker generation device which has a measurement means, an invariant feature conversion means, a singular feature selection means, and a marker generation means. The measurement means measures a change in posture of an object in a background image on the basis of the image. The invariant feature conversion means indicates feature points extracted from the background image in an invariant feature space by means of a predetermined conversion process in accordance with the change in posture. The singular feature selection means selects, as a singular feature, a part in which the feature points are not indicated in the invariant feature space. The marker generation means generates a marker with the use of the singular feature.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile