The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Dec. 16, 2011
J. Harlan Yates, Melbourne, FL (US);
Mark Rahmes, Melbourne, FL (US);
Michael Mcgonagle, Melbourne, FL (US);
Timothy B. Faulkner, Palm Bay, FL (US);
J. Harlan Yates, Melbourne, FL (US);
Mark Rahmes, Melbourne, FL (US);
Michael McGonagle, Melbourne, FL (US);
Timothy B. Faulkner, Palm Bay, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
Systems () and methods () for efficient feature data analysis. The methods involve: determining a first number of screen pages needed to verify that each of a plurality of clusters of detected features comprises only detected features which were correctly identified during feature extraction/detection operations as being of the same feature class as a selected feature of an image; determining a second number of screen pages needed to verify that each of a plurality of singular detected features was correctly identified during the feature extraction/detection operations as being of the same feature class as the selected feature of the image; selecting one of a plurality of different validation processes based on values of the first number of screen pages and the second number of screen pages; and performing the selected validation process to verify that each of the detected features does not constitute a false positive.