The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Apr. 18, 2012
Kian Wai NG, Irvine, CA (US);
Kameron K. Jung, Yorba Linda, CA (US);
Jinghuan Chen, Irvine, CA (US);
Kian Wai Ng, Irvine, CA (US);
Kameron K. Jung, Yorba Linda, CA (US);
Jinghuan Chen, Irvine, CA (US);
Western Digital Technologies, Inc., Irvine, CA (US);
Abstract
In various embodiments, systems and methods to detect signal irregularity caused by defects in the read/write head element are disclosed. In some embodiments, an exemplary system comprises a memory and a processor. The processor is coupled to the memory and is configured to implement a filter module and a detector module. The filter module is configured to generate a test waveform based on data read from a medium by a storage device head to be tested. The detector module is configured to generate a signal quality value based on a property of at least a portion of the test waveform, compare the signal quality value to an event threshold, and generate an event indicator based on the comparison, the event indicator indicating possible instability of the storage device head.