The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Nov. 27, 2009
Hideyuki Hashi, Osaka, JP;
Kenichi Hayashi, Nara, JP;
Hiroya Kusaka, Hyogo, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A shake measurement system () is an apparatus for measuring the amount of shake of a camera (), and comprises a first shake amount acquisition section, a second shake amount acquisition section, and a third shake amount acquisition section. The first shake amount acquisition section uses image processing to acquire the amount of shake of the camera () as a first shake amount. The second shake amount acquisition section acquires the amount of shake of the camera () as a second shake amount by a different method from that of the first shake amount acquisition section. The third shake amount acquisition section acquires the amount of translational shake of the camera () on the basis of the first shake amount and the second shake amount.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile