The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Sep. 22, 2011
Applicants:

Patrick Gross, Langensendelbach, DE;

Antje Kickhefel, Erlangen, DE;

Joerg Roland, Hemhofen, DE;

Inventors:

Patrick Gross, Langensendelbach, DE;

Antje Kickhefel, Erlangen, DE;

Joerg Roland, Hemhofen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a magnetic resonance (MR) method and apparatus for spatially resolved determination of at least one MR parameter that influences an MR signal detected in an MR measurement of a region of an examination subject, first complex image data and second complex image data, respectively acquired with different acquisition coils and at different echo times in an echo imaging sequence, are provided to a processor. The different image data sets have complex image points that correspond with each other with regard to the imaged volume element of the examination subject. The MR parameter is determined in the processor for at least a portion of these image points by determination of an image point vector respectively for the first and second echo times and by combining the image point vectors to at least partially compensate echo time-independent phase or magnitude portions in the acquired image data.


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