The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Dec. 07, 2011
Applicant:
Po-chao Tan, New Taipei, TW;
Inventor:
Po-Chao Tan, New Taipei, TW;
Assignee:
Brymen Technology Corporation, New Taipei, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A clamp meter with multipoint measurement includes a current-measuring unit, an analog-to-digital converting unit, and a measuring-position judgment unit. The current-measuring unit includes a plurality of current-measuring positions calibrated according to the measuring-position judgment unit. The current-measuring unit measures the current of the current-measuring position judged by the measuring-position judgment unit.
Tan, Po-Chao. (2014). Clamp meter with multipoint measurement (U.S. Patent No. 8754636). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8754636
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile