The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Mar. 10, 2011
Christopher D. Lofstrom, Fort Collins, CO (US);
Daniel N. Fox, Fort Collins, CO (US);
Thomas L. Thrasher, Fort Collins, CO (US);
David C. Neckels, Berthoud, CO (US);
Christopher D. Lofstrom, Fort Collins, CO (US);
Daniel N. Fox, Fort Collins, CO (US);
Thomas L. Thrasher, Fort Collins, CO (US);
David C. Neckels, Berthoud, CO (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
A method is provided for generating measurement parameters for a particle sample in a particle analyzer. The method includes, interrogating the particle sample with a triggering interrogator and one or more secondary interrogators respectively positioned along a length of an interrogation area, generating respective pulses based upon the interrogation of a first particle from the particle sample, determining a primary pulse detection window based upon a triggering pulse, determining a search interval to find a secondary pulse based upon factors including the primary pulse detection window and a laser delay, adjusting the search interval for laser delay variation dynamically based on the interrogation of the first particle, identifying the secondary pulse in the adjusted search interval, and processing the secondary pulse to determine a peak value of the secondary pulse. Corresponding apparatus are also provided.