The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Sep. 08, 2010
Applicants:

Kenzo Machida, Kanagawa, JP;

Noriyuki Kishii, Kanagawa, JP;

Mari Ichimura, Kanagawa, JP;

Kazumine Ito, Tokyo, JP;

Takuya Kishimoto, Tokyo, JP;

Naohisa Sakamoto, Tokyo, JP;

Inventors:

Kenzo Machida, Kanagawa, JP;

Noriyuki Kishii, Kanagawa, JP;

Mari Ichimura, Kanagawa, JP;

Kazumine Ito, Tokyo, JP;

Takuya Kishimoto, Tokyo, JP;

Naohisa Sakamoto, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a microbead analysis method for a microbead. The microbead is formed in a columnar shape having a top surface and a bottom surface facing each other, as placed almost in parallel, and a side surface extending therefrom, and carries an identification pattern formed on at least one of the top surface and the bottom surface and a substance immobilized on a surface thereof having affinity to an analyte substance. The method includes detecting fluorescence emitted from the microbead surface due to interaction of the analyte substance with the substance having affinity to the analyte substance from a region including a region of the top surface and the bottom surface where there is no identification pattern formed and the side surface.


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