The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Dec. 16, 2011
Jagdish M. Jethmalani, San Diego, CA (US);
Laurence Warden, Poway, CA (US);
Shui T. Lai, Encinitas, CA (US);
Andreas W. Dreher, Escondido, CA (US);
Jagdish M. Jethmalani, San Diego, CA (US);
Laurence Warden, Poway, CA (US);
Shui T. Lai, Encinitas, CA (US);
Andreas W. Dreher, Escondido, CA (US);
Essilor International (Compagnie General d'Optique), Charenton Cedex, FR;
Abstract
A method of manufacturing an optical lens that is configured to correct high order aberrations. One embodiment is a method of customizing optical correction in an optical system. The method includes measuring optical aberration data of the optical system. The method further includes calculating a lens definition based on the optical aberration data. Calculating the lens definition may include calculating a correction of at least one high order optical aberration. The method further includes fabricating a correcting lens based on the lens definition.