The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Jan. 17, 2011
Applicant:

Bruce Lee Coulter, Rockford, IL (US);

Inventor:

Bruce Lee Coulter, Rockford, IL (US);

Assignee:

Evoqua Water Technologies LLC, Alpharetta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C02F 1/32 (2006.01); C02F 103/04 (2006.01); C02F 1/00 (2006.01); C02F 9/00 (2006.01); C02F 1/04 (2006.01);
U.S. Cl.
CPC ...
C02F 1/32 (2013.01); C02F 1/325 (2013.01); C02F 1/008 (2013.01); C02F 9/00 (2013.01); C02F 2103/04 (2013.01); C02F 1/045 (2013.01); Y10S 210/90 (2013.01); Y10S 210/908 (2013.01);
Abstract

A method and system of providing ultrapure water for semiconductor fabrication operations is provided. The water is treated by utilizing a free radical scavenging system and a free radical removal system. The free radical scavenging system can utilize actinic radiation with a free radical precursor compound, such as ammonium persulfate. The free radical removal system can comprise use of a reducing agent. The ultrapure water may be further treated by utilizing ion exchange media and degasification apparatus. A control system can be utilized to regulate addition of the precursor compound, the intensity of the actinic radiation, and addition of the reducing agent to the water.


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