The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Apr. 15, 2010
Applicants:

Andreas Schenk, Erlangen, DE;

Markus Walter, Bamberg, DE;

Inventors:

Andreas Schenk, Erlangen, DE;

Markus Walter, Bamberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for checking a data processing device to determine its suitability for performing failsafe automation processes, wherein the data processing device includes a first and a second time base. The method comprises determining a first time value of the first time base after expiration of a time period of length T, determining a second time value of the second time base after the expiration of the time period of length T, determining a deviation between the first and the second time value, and initiating a troubleshooting measure if the deviation undershoots, i.e., undershoots or reaches, a predefined or pre-definable limit value.


Find Patent Forward Citations

Schenk, Andreas. (2014). Method for checking suitability of a data processing device for performing failsafe automation processes (U.S. Patent No. 8751875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8751875

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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