The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Dec. 30, 2011
Applicants:

Deepak M. Gaikwad, Mississauga, CA;

Robert J. Pellowski, Ledyard, CT (US);

Edith Epstein, Arlington, MA (US);

Hitesh Trivedi, Cambridge, MA (US);

Helen S. Raizen, Jamaica Plain, MA (US);

Inventors:

Deepak M. Gaikwad, Mississauga, CA;

Robert J. Pellowski, Ledyard, CT (US);

Edith Epstein, Arlington, MA (US);

Hitesh Trivedi, Cambridge, MA (US);

Helen S. Raizen, Jamaica Plain, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved technique for storing I/O metrics includes assigning metric values to data buckets held in kernel memory. Each data bucket covers a particular range of values of a respective metric and is configured as a counter, whose count is incremented each time the multipathing driver obtains or computes a metric value that falls within the range of the data bucket. Bucket counts can be read by an external program to obtain aggregate information about I/O metrics over time. The aggregate information can be fed back to the multipathing driver to enable improved selections of paths for conveying data to and from a storage array.


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