The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Nov. 14, 2008
Applicants:
Mark Huang, Seattle, WA (US);
Edward K. Lee, San Jose, CA (US);
Kai LI, Seattle, WA (US);
Philip Shilane, Morrisville, PA (US);
Grant Wallace, Ewing, NJ (US);
Ming Benjamin Zhu, Austin, TX (US);
Inventors:
Mark Huang, Seattle, WA (US);
Edward K. Lee, San Jose, CA (US);
Kai Li, Seattle, WA (US);
Philip Shilane, Morrisville, PA (US);
Grant Wallace, Ewing, NJ (US);
Ming Benjamin Zhu, Austin, TX (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 7/00 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1453 (2013.01);
Abstract
Delta compression after identity deduplication is disclosed. A first data segment is determined to be identical to a first previous data segment. A second data segment, not determined to be identical to a second previous data segment, is then determined to be similar to a third previous data segment.