The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Mar. 17, 2011
Thomas Britton Lowry, Matthews, NC (US);
OM Purushotham Akarapu, Hyderabad, IN;
Srihari Rao Gatpa, Hyderabad, IN;
Thomas Britton Lowry, Matthews, NC (US);
Om Purushotham Akarapu, Hyderabad, IN;
Srihari Rao Gatpa, Hyderabad, IN;
Bank of America Corporation, Charlotte, NC (US);
Abstract
Methods, computer readable media, and apparatuses for analyzing data quality are presented. Transaction information may be received from a database, and the transaction information may describe various aspects of a plurality of transactions handled by an organization. Subsequently, a forecast may be calculated based on the transaction information, and the forecast may predict the future value of a metric. An upper control limit and a lower control limit for the metric may be determined based on the transaction information. Thereafter, the latest actual value of the metric may be computed. A normalized quality score for the metric then may be calculated based on the latest actual value of the metric, the forecast, the upper control limit, and the lower control limit. Optionally, a chart may be generated to evaluate data quality for a plurality of metrics, and metrics that exceed a control limit may be added to an issue log.