The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jan. 04, 2012
Applicants:

Matt Hollingsworth, Redmond, WA (US);

Colleen Hamilton, Kirkland, WA (US);

John M. Oslake, Seattle, WA (US);

Shawn Bice, Sammamish, WA (US);

Narayan Nevrekar, Bellevue, WA (US);

Inventors:

Matt Hollingsworth, Redmond, WA (US);

Colleen Hamilton, Kirkland, WA (US);

John M. Oslake, Seattle, WA (US);

Shawn Bice, Sammamish, WA (US);

Narayan Nevrekar, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06F 3/023 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 3/023 (2013.01);
Abstract

A method includes displaying a plurality of user modifiable utilization views of a monitored software application, where each of the plurality of user modifiable utilization views is customizable to fit a domain of analysis by identifying one or more resource types of multiple resource components. Each of the plurality of user modifiable utilization views is displayed in one more graphical user interfaces. The method includes determining a desired ordering of the one or more resource types within a hierarchy of types and filtering one or more details of the multiple resource components to create a customized view. A user can navigate between each of the plurality of user modifiable utilization views to dynamically construct related target analysis views including filtered details across one or more other domains of analysis.


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